| Electronics Test and Measurement |
Electronics Test and Measurement
for summaries, information, tutorials and data about electronics test and
measurement techniques and electronic test and measurement equipment from ICT to
boundary scan / JTAG and GPIB to instruments including automatic test equipment,
spectrum analyzers, logic analyzers and oscilloscopes.
Test methodologies
There are many ways in which electronic assemblies can be tested. Where they are
forms of inspection to ensure that they have been built correctly, or functional
tests that check the operation, each type of this form of electronics test and
measurement has its own advantages and disadvantages.
In-Circuit Test (ICT)
Functional Test (FATE)
Automatic
Optical Inspection (AOI) and X-Ray inspection
Boundary Scan (JTAG / IEEE 1149) Tutorial
Boundary Scan Description Language, BSDL
Designing for boundary scan test
The JTAG specifications and the IEEE 1149 series of standards that define
boundary scan
The JTAG, boundary scan interface
Electronics Test and Measurement strategies
In order to ensure that an assembly can be properly tested it is necessary to
develop a proper test strategy. Only in this way can any product be tested
effectively and for the minimum cost.
Developing a successful test strategy for production test
Design for test (DFT)
The different types of test available for production testing
Selecting an In Circuit Tester
Test equipment technologies
There are a number of standards and technologies that can be used for
controlling test equipment. GPIB, VXI and now PXI are some of the main ones that
are available today.
GPIB
What is it?
Pin connections for the GPIB connector
VXIbus for
high speed integrated test systems
PXIbus
an overview of PXI technology
Technical Summary of the PXI System
PXI Express
LXI test
technology basics
EMC, Electro-Magnetic Compliance
In recent years, Electromagnetic Interference, EMI, and Electromagnetic
Compatibility, EMC, have become very important topics. As a result, testing for
compliance with the EMC directive and other standards has become more important.
With EMC compliance now an essential requirement before products can be launched
onto the market, EMC testing is of interest to all electronic equipment
developers and manufacturers.
Basics of EMC / EMI compliance test
Data acquisition
Techniques, equipment, and software used to acquire or collect data, process it,
store and use it to provide essential data about processes and other conditions.
Basics of data acquisition
USB data acquisition
Data acquisition measurements the basics of the measurement techniques
used and the precautions to be taken.
Thermocouples for data acquisition the basics of the measurement
techniques used and the precautions to be taken.
Strain gauges for data acquisition the basics of the measurement
techniques used and the precautions to be taken.
Flow meters for process control and data acquisition the basics of the
measurement techniques used and the precautions to be taken.
Environmental stress screening
Techniques to ensure that high quality product is produced are essential in
today's development and production environments. Environmental stress screening
is widely used with highly accelerated life testing (HALT) in development and
highly accelerated stress screening (HASS) in production as part of an
electronics test and measurement strategy.
Basics of environmental stress screening (ESS)
Highly accelerated life test (HALT) and highly acccelerated stress screening
(HASS)
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